Advances in Theoretical & Computational Physics(ATCP)

Metrology and Instrumentation

Metrology and Instrumentation: Practical Applications for Engineering and Manufacturing provides students and professionals with an accessible foundation in the metrology techniques, instruments, and governing standards used in mechanical engineering and manufacturing.

Journal key Highlights

Applied Physics Astronomy and Astrophysics Atmosphere and Climate Physics Atomic and Molecular Physics Atomic Physics Bio Photonics Bio Physics Biological and Medical Physics Chemical Physics Classical and Modern Physics Classical Mechanics Computational and Data Science Computational Physics and Numerical Simulation Condensed Matter Physics Cosmic rays Environmental Physics Fluid dynamics Fluid Mechanics Gas-Discharge Physics Geophysics and Planetary science Gravitation and Cosmology High-energy and particle physics Instrumentational Physics Magnetic Materials Magnetism Material Physics Materials science Mathematical Physics Mathematical Physics Mechanics Medical Physics Mesoscopics Metrology and Instrumentation Microscopy Molecular Physics Nanophysics Nanotechnology Networks and complex systems Nonlinear dynamics Nuclear Physics Optics and Lasers Optics, Lazers, Photonics Particle Accelerators Particle Physics Planetory Physics Quantum Mechanics and Quantum Information Theory Quantum Physics Quantum physics and quantum information Quantum Physics and Technology Radiation Protection Semiconductor physics Soft matter physics Solar Physics Statistical Mechanics Statistical physics and Thermodynamics Statitical Physics Superconductivity and Superfluidity Thermodynamics, Fluid Dynamics and Statistical Physics Thermodynamics, Thermokinetics, Fluid Dynamics