Journal of Electrical Electronics Engineering(JEEE)
ISSN: 2834-4928 | DOI: 10.33140/JEEE
Impact Factor: 1.2
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Design, Physical Analysis, and Area Scaling Assessment of a 2 nm Single-Fin FinFET with Monolithic Self-Aligned Nanowire Interconnects
Citation
Khalesi, E. (2026). Design, Physical Analysis, and Area Scaling Assessment of a 2 nm Single-Fin FinFET with Monolithic Self-Aligned Nanowire Interconnects. J Electrical Electron Eng, 5(5), 01-08.